Gunawan, R. and Sugiarti, E. and Isnaeni, Isnaeni and Purawiardi, R. I. and Widodo, H. and Muslimin, A. N. and Yuliasari, Yuliasari and Ronaldus, C. E. and Prastomo, Niki and Hastuty, S. (2018) Effect of high current density to defect generation of blue LED and its characterization with transmission electron microscope. In: 3rd International Symposium on Frontier of Applied Physics, 23–24 October 2017, Jakarta, Indonesia.
Full text not available from this repository.Abstract
The optical, electrical and structural characteristics of InGaN-based blue light-emitting diodes (LEDs) were investigated to identify the degradation of LED before and after current injection. The sample was injected by high current of 200 A/cm2 for 5 and 20 minutes. It was observed that injection of current shifts light intensity and wavelength characteristics that indicated defect generation. Transmission Electron Microscopy (TEM) characterization was carried out in order to clarify the structure degradation caused by defect in active layer which consisted of 14 quantum well with thickness of about 5 nm and confined with barrier layer with thickness of about 12 nm. TEM results showed pre-existing defect in LED before injection with high current. Furthermore, discontinue and edge defect was found in dark spot region of LED after injection with high current.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Subjects: | 500 Science and Mathematic > 500 Science > 507 Education, Research, Related Topics |
| Divisions: | Faculty of Engineering & Informatics > Engineering Physics |
| Depositing User: | Administrator UMN Library |
| Date Deposited: | 09 Dec 2021 18:06 |
| Last Modified: | 09 Dec 2021 18:06 |
| URI: | https://kc.umn.ac.id/id/eprint/19460 |
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