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Skromme, B. J. and Palle, K. C. and Mikhov, M. K. and Meidia, Hira and Mahajan, Subhash D. and Huang, X. R. and Vetter, W. M. and Dudley, M. and Moore, K. and Smith, S. and Gehoski, T. (2003) Effects of Structural Defects on Diode Properties in 4H-SiC. MRS Online Proceedings Library.