Items where Author is "Skromme, B. J."

Ding, Y. and Park, K-B and Pelz, J. P. and Palle, K. C. and Mikhov, M. K. and Skromme, B. J. and Meidia, Hira and Mahajan, Subhash D. (2004) Cubic inclusions in 4H-SiC studied with ballistic electron-emission microscopy. Journal of Vacuum Science & Technology A, 22 (4). ISSN 1520-8559

Ding, Y. and Park, Han Bi and Pelz, J. P. and Palle, K. C. and Mikhov, M. K. and Skromme, B. J. and Meidia, Hira and Mahajan, S (2004) Quantum well state of self-forming 3C−SiC inclusions in 4H SiC determined by ballistic electron emission microscopy. Physical Review B, 69 (4). ISSN 2469-9969

Skromme, B. J. and Palle, K. C. and Mikhov, M. K. and Meidia, Hira and Mahajan, Subhash D. and Huang, X. R. and Vetter, W. M. and Dudley, M. and Moore, K. and Smith, S. and Gehoski, T. (2003) Effects of Structural Defects on Diode Properties in 4H-SiC. MRS Online Proceedings Library.