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Ding, Y. and Park, K-B and Pelz, J. P. and Palle, K. C. and Mikhov, M. K. and Skromme, B. J. and Meidia, Hira and Mahajan, Subhash D. (2004) Cubic inclusions in 4H-SiC studied with ballistic electron-emission microscopy. Journal of Vacuum Science & Technology A, 22 (4). ISSN 1520-8559
Harahap, Caesar O. and Miura, Hideaki (2009) Numerical Computation of Flows with Moving Boundaries Using an Immersed Interface Method. Journal of Plasma and Fusion Research SERIES, 8. ISSN 1883-9630
Ishida, Toshiki and Harahap, Caesar O. and Steinhauer, Loren C. and Peng, Martin Y-K (2004) Improved Formalism for Flowing Two-Fluid Equilibrium and Its Application to ST. Journal of Plasma and Fusion Research SERIES, 6. pp. 531-533. ISSN 1883-9630
Meidia, Hira and Cullis, Anthony G. and Schönjahn, Cornelia and Münz, Wolf Dieter and Rodenburg, John Marius (2002) Investigation of intermixing in TiAlN/VN nanoscale multilayer coatings by energy-filtered TEM. Surface and Coatings Technology, 151. pp. 209-213. ISSN 0257-8972
Meidia, Hira and Mahajan, Subhash D. (2013) Influence of LT-AlN buffer layers on density of threading dislocation in AlGaN layers. In: 10th IEEE International Conference on Semiconductor Electronics, 19-21 Sept. 2012, Kuala Lumpur, Malaysia.
Muchtadi, Farida I. and Suprijanto, Suprijanto and Ismail, Gunawan and Susanti, Hesty and Prasetyo, Merlinda and Salehuddin, Muhammad (2013) Effect of an acupuncture stimulation on human body stamina improvement based on statistical electromyography analysis. International Journal of Applied Mathematics and Statistics, 35 (5). pp. 119-136. ISSN 0973-7545
Pane, Ivransa Zuhdi and Asano, Tanemasa (2009) Analysis and Fabrication of Ampere-Force Actuated Bistable Curved Beam. Japanese Journal of Applied Physics, 48 (6S).
Pane, Ivransa Zuhdi and Asano, Tanemasa (2018) Investigation on bistability and fabrication of bistable prestressed curved beam. Japanese Journal of Applied Physics, 47 (6S).
Thomas, P. J. S. and Hosea, T. J. C. and Lancefield, D. and Meidia, Hira (2000) Monitoring thickness changes in GaAs/AlAs partial VCSEL Bragg reflector stacks using optical spectroscopic, x-ray and electron microscopic methods. Semiconductor Science and Technology, 16 (2). pp. 107-117. ISSN 1361-6641