Rahman, Arief Noor and Li, Meng-Yang and Tampubolon, Marojahan and Chiu, Huang-Jen (2019) High Resolution Dynamic RDS(on) Measurement of GaNFET using Active VDS(on) Measurement Clamp Circuit. In: 2019 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia, 23-25 May 2019, Taipei, Taiwan.
Full text not available from this repository.Abstract
This paper presents the high resolution dynamic on-resistance measurement for GaN device at the system level. The proposed method improves the measurement output linearity and vertical accuracy. It is achieved by omitting the high voltage blocking diode in the main measurement signal path and using the negligible active clamp resistance compared to the instrument resistance. This method also reduces the measurement transient time that provides a fast measurement performance which is important for high speed testing. In this paper the theoretical analysis, method, and hardware designed are explained in detail. In the end, a system verification was built to verify the proposed method.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Keywords: | dynamic Rdson , GaNFET , Vdson measurement , voltage clamping circuit |
| Subjects: | 600 Technology (Applied Sciences) > 600 Technology > 607 Education, Research, Related Topics |
| Divisions: | Faculty of Engineering & Informatics > Electrical Engineering |
| Depositing User: | Administrator UMN Library |
| Date Deposited: | 08 Dec 2021 12:11 |
| Last Modified: | 08 Dec 2021 12:11 |
| URI: | https://kc.umn.ac.id/id/eprint/19422 |
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