Items where Year is 2000
 | Up a level |
Jump to: T
Number of items: 1.
T
Thomas, P. J. S. and Hosea, T. J. C. and Lancefield, D. and Meidia, Hira (2000) Monitoring thickness changes in GaAs/AlAs partial VCSEL Bragg reflector stacks using optical spectroscopic, x-ray and electron microscopic methods. Semiconductor Science and Technology, 16 (2). pp. 107-117. ISSN 1361-6641
This repository is indexed on
This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.