Items where Year is 2000

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Article

Thomas, P. J. S. and Hosea, T. J. C. and Lancefield, D. and Meidia, Hira (2000) Monitoring thickness changes in GaAs/AlAs partial VCSEL Bragg reflector stacks using optical spectroscopic, x-ray and electron microscopic methods. Semiconductor Science and Technology, 16 (2). pp. 107-117. ISSN 1361-6641

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